数字IC测试 MATE-TC3000
后面板
厂家: MICROTEK INTERNATIONAL Inc.
The equipment normally used in integrated circuit testing costs hundreds of thousands of dollars,occupies several hundred square feet of floor space,requires expensive technical support and is economically out of the reach of the majority of integrated circuit end-users.
small functional testers can resolve the cost dilemma.however virtually all benchtop testers
on the market today are cumbersome,slow and difficult to use.many of them require plug-in modules,adaptor boards,multiple switches and user programming.
microtek international,Inc.has resolved most of the shortcoming in benchtop functional testing with the MATE-TC3000.This remarkable inexpensive instrument can functionally test some 1500 TTL and 200 CMOS ICs.simply by keying in a generic type number and a start key,one of hundreds of unique functional test patterns will be exercised in milliseconds and the results provided instantly by "PASS" or "FALL" LED displays on console.
The TC3000 is so simple to use that any operator can be trained to perform IC functional tests in a matter of minutes.
High accuracy and fast throughpput make the TC3000 ideal as a quality control,inspection,diagnostic and trouble-shooting tool.
throughput is normally limited by the speed with which an operator can manually load/unload devices
100% functional testing of integrated circuits prior to assembly will remove defectives devices that may become costly repair items,improve overall product reliability and reduce expensive field failures.using the TC3000 to test and confirm device failures provides significant assistance in trouble shooting and maintenance of all electonic equipment employing TTL or CMOS ICs.The TC3000 is an excellent tool that assists in circuit debugging ,in the laboratory and in educational institutions.
The TC3000 belongs anywhere TTL or CMOS ICs are used,sold or produced.but this tester is much more than a simple benchtop tester.there are a number of other unique and useful functions designed into this system which are detailed in the following chapters